XRF Core Scanner <High Resolution Model>
Millimeter-level analytical resolution! Fluorescent X-ray analysis of core samples in mineral exploration and geological surveys.
We would like to introduce our "XRF Core Scanner <High Resolution Model>." It quantifies concentrations of matrix elements from trace levels. Using X-ray fluorescence (XRF), it performs elemental analysis and quantification in millimeter and sub-millimeter units for core sample materials from Na to U. Additionally, we also offer a "Simple Model" and a "High Throughput Model." Please feel free to contact us if you have any requests. 【Features】 ■ Analysis resolution in millimeter units, 24-hour automatic analysis ■ Scanning from Na to U (dry samples), Mg to U (wet samples) in one scan ■ Quantification of concentrations from trace levels to matrix elements ■ Magnetic susceptibility measurement, NIR (near-infrared), UV-VIS fluorescence spectroscopy (optional) *For more details, please refer to the PDF document or feel free to contact us.
- Company：ジャスコインタナショナル 第二事業部
- Price：Other
